Proton-Induced X-Ray Emission Analysis - A New Tool in Quantitative Dermatology
Proton-Induced X-ray emission analysis (PIXE) constitutes a method for trace element analysis characterized by multielemental capability, detection limits in the low ppm-range and size resolution down towards a micrometre. In applications where the sensitivity of the Electron-Induced X-ray Emission (EIXE) analysis is not sufficient and where a spatial resolution not better than a few micrometres i
